发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE TRANSFERRING METHOD
摘要 A resist coating/developing system comprises a cassette station, a process station, and an interface station. A second wafer transfer member for transferring the wafer from a high precision temperature control unit mounted to the interface station to an in-stage of a light exposure device provisionally disposes the wafer held by the second wafer transfer member on a restoration unit in the case where the wafer was taken out from the high precision temperature control unit because it was possible to transfer the wafer onto the in-stage, but it was rendered impossible later to transfer the wafer W onto the in-stage.
申请公布号 KR100919084(B1) 申请公布日期 2009.09.28
申请号 KR20030005726 申请日期 2003.01.29
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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