| 摘要 |
FIELD: process engineering. ^ SUBSTANCE: invention relates to production quality control. Proposed method comprises generating one or more process reference signals (xref), deriving one or more actual signals (xreal) that define the quality of aforesaid production process, and comparing aforesaid reference signals with actual signals to reveal defects in the process under consideration. In compliance with this invention, proposed method additionally comprises producing signal (Xref-inv-norm) converted from aforesaid reference signal (xref), producing signal (Xreal-inv-norm) converted from aforesaid actual signal (xreal), computing energies (Eref, Ereal) of aforesaid converted signals, respectively. Note that aforesaid comparison is carried out to derive appropriate frequency-time distributions (Tfdref, Tfdreal) for selected frequency values (f-e). The method includes also computation of energies (Etreal, Etref) of aforesaid frequency-time distributions (Tfdref, Tfdreal) and comparison of the latter with threshold values (max-Tfdref) to identify magnitudes of energies associated with defects. ^ EFFECT: accurate determination of defects. ^ 11 cl, 6 dwg |
