发明名称 POLISHING SOLUTION FOR CMP, METHOD OF POLISHING SUBSTRATE AND ELECTRONIC COMPONENTS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a CMP polishing solution with sufficiently fast polishing speed on a silicon oxide film, capable of stably polishing the film at high polishing speed with variations control, and to provide a method of polishing a substrate and electronic components. <P>SOLUTION: The CMP polishing solution contains a conductivity adjusting agent, an inorganic abrasive, and a dispersant; and has conductivity of 8 mS/m to 1,000 mS/m, and pH of 3.0 to 7.0. The polishing method includes a step of compressively applying a substrate on which a polished film is formed, onto a polishing cloth of a polishing fixed platen; and polishing a substrate by moving the substrate relatively to the polishing fixed platen for polishing the substrate, while feeding the CMP polishing solution between the polished substrate and the polishing cloth. The polished substrate polished by the method is used for the electronic components. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009218558(A) 申请公布日期 2009.09.24
申请号 JP20080276095 申请日期 2008.10.27
申请人 HITACHI CHEM CO LTD 发明人 SATO HIDEKAZU;OTA MUNEHIRO;NOBE SHIGERU;MIYAOKA SEIJI;FUKAZAWA MASATO;ENOMOTO KAZUHIRO;KOYAMA NAOYUKI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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