发明名称 WAFER CLEANING EQUIPMENT AND PRODUCTION PROCESS OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide wafer cleaning equipment which can remove polymer or contamination surely with chemical or deionized water, and to provide a production process of a semiconductor device. SOLUTION: Wafer cleaning equipment comprises a wafer holding mechanism 1 for holding a semiconductor wafer 3, a rotary mechanism for rotating the wafer holding mechanism 1, a chemical nozzle 5 or a deionized water nozzle 4 provided above the wafer holding mechanism 1 and delivering chemical or deionized water to the surface of the semiconductor wafer 3, and a chemical holding tool 6 arranged on the outside of the wafer holding mechanism 1 to cover the bevel portion of the semiconductor wafer 3 and holding the chemical or deionized water temporarily at the bevel portion. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009218249(A) 申请公布日期 2009.09.24
申请号 JP20080057400 申请日期 2008.03.07
申请人 SEIKO EPSON CORP 发明人 UENO KAZUNORI
分类号 H01L21/304;H01L21/306 主分类号 H01L21/304
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