发明名称 Method of detecting a defect on an object
摘要 In a method of detecting a defect on an object, a preliminary reference image can be obtained from a plurality of comparison regions defined on the object. The preliminary reference image is divided into reference zones by a similar brightness. Each of the reference zones is provided with substantially the same gray level, respectively, to obtain a reference image. Whether a defect exists in an inspection region in the comparison regions is determined using the reference image. Thus, defects in the inspection regions having different brightnesses can be detected using the properly obtained reference image.
申请公布号 US2009238445(A1) 申请公布日期 2009.09.24
申请号 US20090383017 申请日期 2009.03.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG YU-SIN;SONG KYUNG-SUK;KIM JI-HAE;JUN CHUNG-SAM
分类号 G06K9/00 主分类号 G06K9/00
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