发明名称 TEST DEVICE, DEMODULATION DEVICE, TEST METHOD, DEMODULATION METHOD, AND ELECTRONIC DEVICE
摘要 <p>Provided is a test device for testing a DUT (device under test) which outputs an amplitude phase modulation signal having a level and a change point phase selected from a plurality of levels and phases in accordance with transfer data. The test device includes a comparison unit and a judgment unit. The comparison unit compares a first comparison level smaller than an expected level to an output signal before the expected phase and compares a second comparison level greater than the expected level and a third comparison level smaller than the expected level to an output signal after the expected phase. The judgment unit judges that the output signal coincides with the expected value if the output signal is not greater than the first comparison level before the expected phase and not greater than the second comparison level and not smaller than the third comparison level after the expected phase.</p>
申请公布号 WO2009116238(A1) 申请公布日期 2009.09.24
申请号 WO2009JP00989 申请日期 2009.03.04
申请人 ADVANTEST CORPORATION;YAMAMOTO, KAZUHIRO;OKAYASU, TOSHIYUKI 发明人 YAMAMOTO, KAZUHIRO;OKAYASU, TOSHIYUKI
分类号 G01R31/319;H04L27/00 主分类号 G01R31/319
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