发明名称 ANNEALING APPARATUS AND OVERHEAT PREVENTION SYSTEM
摘要 Annealing apparatus (100) is provided with a chamber (2) for housing a wafer (W), heating sources (17a, 17b) which have a plurality of LEDs (33) irradiating the wafer (W) within the chamber (2) with light, a power source part (60) which feeds power to the LEDs (33) of the heating sources (17a, 17b), light transmission members (18a, 18b) which transmit light from the LEDs (33), an exhaustion mechanism which exhausts the inside of the chamber (2), a temperature calculation part (62) which calculates the temperature of the LEDs (33) on the basis of current-voltage properties in pn-junction of the LEDs (33) and those in the resistance of the LEDs, and an interlock part (63) which stops feeding of power by the power source part (60) when the temperature calculated by the temperature calculation part (62) exceeds a predetermined temperature.
申请公布号 WO2009116400(A1) 申请公布日期 2009.09.24
申请号 WO2009JP54159 申请日期 2009.03.05
申请人 TOKYO ELECTRON LIMITED;KASAI, SHIGERU;SUZUKI, TOMOHIRO 发明人 KASAI, SHIGERU;SUZUKI, TOMOHIRO
分类号 H01L21/26 主分类号 H01L21/26
代理机构 代理人
主权项
地址