发明名称 |
METHOD FOR PRODUCING NITRIDE SEMICONDUCTOR SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor substrate production method capable of producing a nitride semiconductor substrate with a small variation in off-axis angle. <P>SOLUTION: The method is a nitride semiconductor substrate production method comprising forming a nitride semiconductor layer 2 on a sapphire substrate 1 and fabricating a self-standing nitride semiconductor substrate 3 by using the nitride semiconductor layer 2 separated from the sapphire substrate 1, wherein the variation in axis C inclination defined as the difference of the maximum and minimum of radially outward inclinations in various points on the surface of the sapphire substrate 1 is 0.3-1°. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009208991(A) |
申请公布日期 |
2009.09.17 |
申请号 |
JP20080052902 |
申请日期 |
2008.03.04 |
申请人 |
HITACHI CABLE LTD |
发明人 |
MEGURO TAKESHI;SUZUKI TAKAMASA;IKEDA TAKESHI |
分类号 |
C30B29/38;C23C16/01;C30B25/18;H01L33/06;H01L33/32 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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