| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring device capable of updating a calibration value in an operation state of the measuring device as it is, to thereby save a repair time of a broken calibration value, and to provide a measuring device having a long lifetime capable of preventing deterioration of a nonvolatile memory caused by updating of the calibration value. SOLUTION: Each group-classified calibration value and each SUM value of each group-classified calibration value are held respectively in an internal memory, and a SUM value to updating data held in a work memory is compared with the SUM value of each group-classified calibration value during operation of the measuring device, and a calibration value corresponding to a different SUM value is rewritten as comparison results. COPYRIGHT: (C)2009,JPO&INPIT
|
