发明名称 DIODE AND FABRICATION METHOD THEREOF
摘要 <p>A diode and a manufacturing method thereof are provided to prevent interference with an adjacent diode by improving the distribution of the ion implanted to the diode. An SEG(Selective Epitaxial Growth) layer(205A) is formed on a surface of the exposed semiconductor by patterning an interlayer dielectric layer(203) on the semiconductor substrate(201). An SEG layer is transformed into a metal silicide layer(207). The interlayer dielectric layer is removed up to the predetermined height. The ion is implanted to the SEG layer. The interlayer dielectric layer is removed by the cleaning process. The interlayer dielectric layer is a silicon oxide layer.</p>
申请公布号 KR20090097451(A) 申请公布日期 2009.09.16
申请号 KR20080022590 申请日期 2008.03.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, MIN YONG;CHAE, SU JIN;LEE, KEUM BUM;LEE, HYUNG SUK
分类号 H01L27/115;H01L29/861 主分类号 H01L27/115
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