LEAKAGE CURRENT ANALYSIS PROGRAM, RECORDING MEDIUM WITH THIS PROGRAM RECORDED, LEAKAGE CURRENT ANALYZER, AND LEAKAGE CURRENT ANALYSIS METHOD

摘要

PROBLEM TO BE SOLVED: To attain high accuracy and high speed of leakage current analysis by obtaining a leakage yield without limiting its distribution shapes. SOLUTION: Data 120 and 130 for analyses representing deviation within a chip/among chips related to gate length of a transistor constituting cells inside a circuit to be designed are input to the leakage current analyzer 100, when dispersion among the chips is treated as a dispersed probability density distribution R. Then, the data 120 and 130 for analyses are used to obtain cumulative probability density where a leak current value of the circuit to be designed ranges between leakage current value I1to Ijgiven arbitrarily. As a result, the leakage yield of the circuit to be designed can be obtained precisely without limiting its distribution shape. COPYRIGHT: (C)2009,JPO&INPIT