发明名称 TEM WITH ABERRATION CORRECTOR AND PHASE PLATE
摘要 PROBLEM TO BE SOLVED: To provide a TEM with a corrector (330) to improve image quality and a phase plate (340) to improve contrast. SOLUTION: This improved TEM comprises a correction system completely placed between an objective system lens and the phase plate, and uses lenses of the corrector to form a magnified image of a diffraction plane on the phase plate. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009193963(A) 申请公布日期 2009.08.27
申请号 JP20090031157 申请日期 2009.02.13
申请人 FEI CO 发明人 PETER CHRISTIAAN TIEMEIJER;DE JONG ALAN FRANK
分类号 H01J37/26;H01J37/153 主分类号 H01J37/26
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