PARALLEL TEST CIRCUIT WITH ACTIVE DEVICES

摘要

In accordance with one embodiment of the invention, a system is provided that comprises a first terminal for receiving an input testing signal during operations; a plurality of input/output terminals coupled with the first terminal; wherein the input/output terminals are configured to parallel output respective output testing signals during parallel output operation; wherein the input/output terminals are configured to parallel input testing response signals during parallel input operation from devices under test; and wherein each of the input/output terminals is electrically isolated during operation from the remaining plurality of input/output terminals.