发明名称 SURFACE INSPECTION METHOD AND INSPECTION DEVICE USING THE SAME
摘要 If an illuminance of a measurement spot is limited in order to prevent heat damage on an article to be inspected, since detection sensitivity and a detection speed are in a relation of trade-off, it is difficult to improve one of them without sacrificing the other or to improve both of them. Also, there is a problem that the detection sensitivity is lowered on an outer circumference portion than on an inner circumference portion of the article to be inspected. A plurality of measurement units comprising an illumination optics, a measurement spot, a collection optics, and a light detection optics are provided, inspection results obtained from the plurality of measurement spots are integrated, and light-amount distribution to each measurement spot is controlled according to a scan radial position.
申请公布号 US2009213364(A1) 申请公布日期 2009.08.27
申请号 US20090367673 申请日期 2009.02.09
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MATSUI SHIGERU
分类号 G01N21/47 主分类号 G01N21/47
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