| 摘要 |
A method for designing an integrated circuit is specified, in which upper and lower limits of dependent component parameters and of environment parameters (3, 4) are determined. The limits of the dependent component parameters are determined in a manner dependent on limits of component fabrication parameters in a worst-case consideration. The dependent component parameters and environment parameters are subsequently first normalized (5) with regard to their limits before experimental designs are constructed and simulations are carried out (6, 7). An analysis of the results (8) yields not only qualitative but also quantitative statements about dependencies of result variables, for example, the bandwidth of a circuit, on principal effects, for example, the drain current of a transistor or the capacitance value of a capacitor component.
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