| 摘要 |
FIELD: physics. ^ SUBSTANCE: in a way of determination of a dielectric coefficient of a curvilinear layer of a substance resonance frequencies are gauged on an output of the dielectric resonator in free space and at a resonator placement on the fixed distance on the one side from a curvilinear layer of a substance; the difference of frequencies is determined, on which, with use of gauge correspondence of a dielectric coefficient on a difference of frequencies and correcting from the thickness, and the layer dielectric coefficient ex is determined. Thus radiuses of curvature of a layer surface in mutually perpendicular planes are defined in a measurement point, the resonator is placed perpendicularly to a measurement point, and actually the dielectric coefficient is defined under the calculation formula. Also the device for determination of a dielectric coefficient of a curvilinear layer of a substance is offered. ^ EFFECT: invention provides increase of accuracy of determination of a dielectric coefficient of a substance curvilinear layer. ^ 2 cl, 5 dwg |
