发明名称 RESISTANCE CHANGE MEMORY DEVICE
摘要 A resistance change memory device including a memory cell array with first wirings, second wirings, and memory cells, the memory cell including a diode and a variable resistance element, anode of diodes being located on the first wiring side, wherein the memory cell array is sequentially set in the following three states after power-on: a waiting state defined by that both the first and second wirings are set at a first voltage; a standby state defined by that the first wirings are kept at the first voltage and the second wirings are set at a second voltage higher than the first voltage; and an access state defined by that a selected first wiring and a selected second wiring are set at a third voltage higher than the first voltage and the first voltage, respectively.
申请公布号 US2009213639(A1) 申请公布日期 2009.08.27
申请号 US20090389606 申请日期 2009.02.20
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TODA HARUKI
分类号 G11C11/00;G11C5/14;G11C11/36;G11C29/00 主分类号 G11C11/00
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