发明名称 IMPURITY ACTIVATING THERMAL PROCESSING METHOD AND THERMAL PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To further enhance an activation rate without increasing an impurity diffusion length for a material having a small thermal resistance such as SiGe or the like also in a millisecond anneal. SOLUTION: A thermal cycle that after a temperature rises at a temperature rising speed of 1.0&times;10<SP>7</SP>(&deg;C/sec) from a first setting temperature T1 to a second setting temperature T2, the temperature is kept for 50 milliseconds or less at the second setting temperature T2, and thereafter, the temperature falls from the second setting temperature T2 to the first setting temperature T1 is repeated consecutively a plurality of times. COPYRIGHT: (C)2009,JPO&amp;INPIT
申请公布号 JP2009188209(A) 申请公布日期 2009.08.20
申请号 JP20080026925 申请日期 2008.02.06
申请人 PANASONIC CORP 发明人 YONEDA KENJI;TAKAHASHI KAZUMA
分类号 H01L21/265;H01L29/78 主分类号 H01L21/265
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