发明名称 PROBE UNIT AND INSPECTION APPARATUS
摘要 A probe unit and an inspection apparatus are provided to maintain test accuracy high by matching suitable impedance according to a test device and the probe unit. In a probe unit and an inspection apparatus, a probe assembly(24) receives a testing signal while being contacted with a testing board. A connection cable(25) connects the probe unit and an external device electrically while having an FPC cable transmitting the electrical signal according to the rest. The FPC cable includes a plurality of signal transmitting a testing signal and an FPC board in which a signal line is formed in one side.
申请公布号 KR20090088784(A) 申请公布日期 2009.08.20
申请号 KR20080122848 申请日期 2008.12.05
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 NARAOKA SYUJI;YAMAUCHI KAZUHIRO
分类号 G01R1/06 主分类号 G01R1/06
代理机构 代理人
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