发明名称 SEMICONDUCTOR DEVICE, ITS MANUFACTURING METHOD, METHOD FOR RECEIVING SIGNAL USING SEMICONDUCTOR DEVICE AND TESTER DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To suppress an increase in a chip size at a time when a signal is transmitted and received to and from the outside by a non-contact. <P>SOLUTION: A semiconductor device 100 contains a semiconductor substrate 102 and bonding pads 110 formed on the semiconductor substrate 102. The semiconductor device 100 further contains inductors 112 being laminated and formed on the bonding pads 110 on the semiconductor substrate 102 and transmitting and receiving signals to and from the outside by the non-contact by an electromagnetic induction. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009181990(A) 申请公布日期 2009.08.13
申请号 JP20080017285 申请日期 2008.01.29
申请人 NEC ELECTRONICS CORP 发明人 NAKASHIBA YASUTAKA
分类号 H01L21/822;H01L21/66;H01L27/04 主分类号 H01L21/822
代理机构 代理人
主权项
地址