发明名称 Interconnect structures and methods for their fabrication
摘要 One or more embodiments of the present invention relate to structures obtained by methods (a) for growing a film by an intermixing growth process, or (b) by depositing a film, which film includes chalcogenides of copper and/or silver (but excluding oxides), such as, for example, copper sulfide (CuSX and/or Cu2SX, where 0.7<=X<=1.3; and X=1.0 for stoichiometric compounds).
申请公布号 US7573133(B2) 申请公布日期 2009.08.11
申请号 US20040858191 申请日期 2004.06.01
申请人 COHEN URI 发明人 COHEN URI
分类号 H01L23/52;H01L21/768;H01L29/40 主分类号 H01L23/52
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