| 摘要 |
A jig for Kelvin Test includes a first probe and a second probe which are arranged in parallel in a socket comprised of insulating material. Probes include a conductive tube and a conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding axially outward from the tube. The tube contains a coil spring adapted to elastically urge the plunger outward. The first probe is used for supplying electric current to a terminal of an electronic component to be tested. The second probe is used for monitoring electric voltage of the terminal. A first cross section of the tube of the first probe which is perpendicular to the axial direction is greater than a second cross section of the tube of the second probe which is perpendicular to the axial direction. The plunger is brought into elastic contact with the terminal.
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