发明名称 SEMICONDUCTOR DEVICE COMPRISING A CAPACITOR IN THE METALLIZATION SYSTEM AND A METHOD OF FORMING THE CAPACITOR
摘要 By forming metal capacitors in the metallization structures of semiconductor devices, complex manufacturing sequences in the device level may be avoided. The process of manufacturing the metal capacitors may be performed on the basis of well-established patterning regimes of modern metallization systems by using appropriately selected etch stop materials, which may enable a high degree of compatibility for forming via openings in a metallization layer while providing a capacitor dielectric of a desired high dielectric constant in the capacitor.
申请公布号 US2009194845(A1) 申请公布日期 2009.08.06
申请号 US20080173268 申请日期 2008.07.15
申请人 WERNER THOMAS;FEUSTEL FRANK;FROHBERG KAI 发明人 WERNER THOMAS;FEUSTEL FRANK;FROHBERG KAI
分类号 H01L21/768;H01L21/02;H01L29/92 主分类号 H01L21/768
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