发明名称 Positive resist composition and pattern-forming method using the same
摘要 <p>A positive resist composition comprises: (A) a resin capable of increasing its solubility in an alkali developer by action of an acid and not containing a silicon atom; (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation, (C) a silicon atom-containing resin having at least one group selected from groups (X) to (Z), (X) an alkali-soluble group, (Y) a group capable of decomposing by action of an alkali developer to increase the solubility of resin (C) in an alkali developer, (Z) a group capable of decomposing by action of an acid to increase the solubility of resin (C) in an alkali developer; and (D) a solvent.</p>
申请公布号 EP2040122(A3) 申请公布日期 2009.08.05
申请号 EP20080167922 申请日期 2006.09.13
申请人 FUJIFILM CORPORATION 发明人 KANDA, HIROMI;KANNA, SHINICHI;INABE, HARUKI
分类号 G03F7/075;G03F7/004 主分类号 G03F7/075
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