发明名称 SEMICONDUCTOR WAFER MANUFACTURING METHOD, AND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a high proximity gettering effect, even if it is an epitaxial wafer, in a semiconductor wafer manufacturing method and a semiconductor wafer. SOLUTION: The method includes a process to carry out a heat treatment for an epitaxial wafer W, which has an epitaxial layer EP formed by epitaxially growing silicon single crystals on the surface of a silicon substrate SUB, in a gas atmosphere. The gas atmosphere of the process contains a nitride gas. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009170940(A) 申请公布日期 2009.07.30
申请号 JP20090111528 申请日期 2009.04.30
申请人 SUMCO CORP 发明人 YAMAOKA TOMONORI;SHIRAKI HIROYUKI;NAKADA YOSHINOBU;HAI SHOEKI
分类号 H01L21/322;H01L21/324 主分类号 H01L21/322
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