| 摘要 |
A semiconductor device includes an input circuit, an output circuit, and a test circuit that is adapted to evaluate delaying of a signal which is input to the input circuit to be output from the output circuit. The test circuit includes a first delay circuit for delaying a signal output from the input circuit, a second delay circuit which is configured of a plurality of serially connected gate circuits and is adapted to further delay a signal output from the first delay circuit, a through-path which is configured of a wiring pattern and is adapted to transmit the signal output from the first delay circuit, a selector that selects one of a signal output from the second delay circuit and a signal transmitted through the through-path according to a control signal to supply the selected signal to the output circuit, and a control signal generating circuit that generates the control signal according to the signal output from the input circuit so as to allow the selector to alternately select the signal output from the second delay circuit and the signal transmitted through the through-path.
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