发明名称 |
SOLID-STATE IMAGING ELEMENT AND MANUFACTURING METHOD THEREOF, AND ELECTRONIC INFORMATION EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging element and a manufacturing method thereof that can simplify manufacturing steps, and electronic information equipment using the solid-state imaging element for an imaging unit. SOLUTION: An antireflective film 42 provided on a photodetector section and a gate side wall film 41 of a transistor of a peripheral circuit of the photodetector section area are formed of a common silicon nitride film 4 formed at the same time, so a silicon nitride film which is as thick as the gate side wall film 41 having a large film thickness is formed first and then formed so as to be a desired film thickness of the antireflective film 42 by using a mask having an opening only on a pixel section. Consequently, it is enough for the silicon nitride film 4 to be formed once. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009170789(A) |
申请公布日期 |
2009.07.30 |
申请号 |
JP20080009550 |
申请日期 |
2008.01.18 |
申请人 |
SHARP CORP |
发明人 |
NAGAI KENICHI;TAKEUCHI NOBORU;OTSUBO KAZUO;HARA YUJI |
分类号 |
H01L27/146;H01L27/14;H01L27/148;H01L31/10;H04N5/335;H04N5/369;H04N5/372;H04N5/374 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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