发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF TESTING SAME |
摘要 |
A semiconductor integrated circuit device includes a first chip that is directly accessible from outside, a second chip that transmits and receives data to and from the first chip, the second chip being not directly accessible from outside, and a through circuit that is provided in the first chip and transmits first and second test signals input from an external device to the second chip, wherein the through circuit includes a first signal transmission path to generate a first signal by synchronizing the first test signal to a clock signal input from the external device and to output it to the second chip and a second signal transmission path to generate a second signal by synchronizing the second test signal to a test clock signal input from the external device and to output it to the second chip.
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申请公布号 |
US2009190417(A1) |
申请公布日期 |
2009.07.30 |
申请号 |
US20090350546 |
申请日期 |
2009.01.08 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
USHIKOSHI KENICHI;TSUNESADA NOBUTOSHI;HIRAKAWA TSUYOSHI;KOMATSU NORIAKI |
分类号 |
G11C7/00;G01R31/26;G11C8/18;H03L7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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