| 摘要 |
PROBLEM TO BE SOLVED: To check an insertion state without lowering an assemble-workability. SOLUTION: A circuit structure includes a mother-substrate having a through-hole, and a sub-substrate 20 mounted on the mother-substrate. An insertion part 27 inserted into the through-hole is provided at the lower end part of the sub-substrate 20, a plurality of conductive parts 29 are formed on the insertion part 27, non-conductive parts 30 are formed between adjacent conductive parts 29, 29, and a mark part 31 is formed on the conductive part 29 and the non-conductive part 30 so as to expose the tip end part of the insertion part 27. A non-conductive mark part 33 formed on the non-conductive parts 30 of the mark part 31 is extended in the tip end direction more than the conductive mark part 32 formed on the conductive part 29 of the mark part 31. As the insertion part can be inserted into the through-hole without interrupted by the mark, the lowering in the assembly-workability can be prevented. In addition, as the insertion part can be properly inserted into the through-hole, the insertion state can be absolutely inspected. COPYRIGHT: (C)2009,JPO&INPIT
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