发明名称 JUNCTION OF SEMICONDUCTOR MEMORY DEVICE AND FORMING METHOD THEREOF
摘要 <p>A junction area of a semiconductor memory device and a forming method thereof are provided to reduce program disturbance property by forming double junction areas between select lines and word lines in a cell region on a semiconductor substrate. A junction area in a semiconductor memory device includes a semiconductor substrate(200) and junction regions(JC). Gate lines are formed in the semiconductor substrate. The junction regions are formed by implanting impurities having different masses into the semiconductor substrate region which is located between the gate lines.</p>
申请公布号 KR20090077300(A) 申请公布日期 2009.07.15
申请号 KR20080003152 申请日期 2008.01.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHON, HYUN SOO
分类号 H01L29/78;H01L21/336;H01L21/8247;H01L27/115 主分类号 H01L29/78
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