发明名称 |
JUNCTION OF SEMICONDUCTOR MEMORY DEVICE AND FORMING METHOD THEREOF |
摘要 |
<p>A junction area of a semiconductor memory device and a forming method thereof are provided to reduce program disturbance property by forming double junction areas between select lines and word lines in a cell region on a semiconductor substrate. A junction area in a semiconductor memory device includes a semiconductor substrate(200) and junction regions(JC). Gate lines are formed in the semiconductor substrate. The junction regions are formed by implanting impurities having different masses into the semiconductor substrate region which is located between the gate lines.</p> |
申请公布号 |
KR20090077300(A) |
申请公布日期 |
2009.07.15 |
申请号 |
KR20080003152 |
申请日期 |
2008.01.10 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SHON, HYUN SOO |
分类号 |
H01L29/78;H01L21/336;H01L21/8247;H01L27/115 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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