发明名称 DEFECT EVALUATION DEVICE OF LENS, AND DEFECT EVALUATION METHOD OF LENS
摘要 PROBLEM TO BE SOLVED: To provide a defect evaluation device of a lens and a defect evaluation method of a lens capable of evaluating objectively and quantitatively a defect of a lens such as a damage degree. SOLUTION: This device is equipped with a light source 11 for irradiating light to a lens 100 which is an evaluation object, a light receiving element 143 for receiving transmission light irradiated from the light source 11 and transmitted through the lens 100, a measuring part 15 for measuring intensity of the transmission light received by the light receiving element 143, a rotation means 16 for rotating relatively the light receiving element 143 with respect to the lens 100, and an output means for outputting the intensity of the transmission light at each measuring angleαwhich is an angle formed between a measuring line A connecting a rotation center of the light receiving element 143 to the light receiving element 143 and an optical axis B of the lens 100. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009150803(A) 申请公布日期 2009.07.09
申请号 JP20070329684 申请日期 2007.12.21
申请人 SEIKO EPSON CORP 发明人 NOGUCHI TAKASHI
分类号 G01M11/00 主分类号 G01M11/00
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