发明名称 |
METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES |
摘要 |
<p>A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.</p> |
申请公布号 |
WO2009083996(A2) |
申请公布日期 |
2009.07.09 |
申请号 |
WO2007IN00622 |
申请日期 |
2007.12.31 |
申请人 |
GENERAL ELECTRIC COMPANY;SANGHAMITHRA, KORUKONDA;SANDEEP, DEWANGAN;PREETI, PISUPATI |
发明人 |
SANGHAMITHRA, KORUKONDA;SANDEEP, DEWANGAN;PREETI, PISUPATI |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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