| 摘要 |
PROBLEM TO BE SOLVED: To improve observability and controllability of analog LSI in a test. SOLUTION: Analog signals inputted from input terminals IN1 to IN3 are supplied to diffusion layer regions 221, 223 and 225 via transistors 301 to 303, and then accumulated as electric charge. Supply of clock signals to signal lines 121 and 122 alternated connected to gate electrodes 211 to 216 causes the accumulated electric to be transferred rightward. Connected to the diffusion layer regions 221, 223 and 225 are charge-voltage conversion amplifiers 411 to 413 by which the accumulated electric charge is converted into voltage to be outputted to output terminals VOUT1 to VOUT3 as analog signals. A scan-in terminal Sin is connected to a diffusion layer region 220, and a scan-out terminal Sout is connected to the diffusion layer region 225 via a charge-voltage conversion amplifier 401. COPYRIGHT: (C)2009,JPO&INPIT
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