发明名称 INSPECTING DEVICE AND INSPECTION PROGRAM
摘要 PROBLEM TO BE SOLVED: To reduce man-hours for selecting non-defective and defective articles in inspecting workpieces. SOLUTION: An inspecting device includes: a first acquisition part having a first imaging part collectively imaging workpieces based on the reflection light from the workpieces and acquiring the first image of the workpiece by the imaging part; a first comparing part comparing the first workpiece image with a first reference image stored in advance; a detecting part detecting a defect candidate region in the first workpiece image based on the comparison results by the first comparing part; a second acquisition part acquiring the second workpiece image corresponding to the defect candidate region; a second comparing part comparing the second workpiece image with a second reference image corresponding to the defect candidate region in the second reference image stored in advance; and a determining part determining whether the defect candidate region is a defect region based on the comparison results by the second comparing part. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009150718(A) 申请公布日期 2009.07.09
申请号 JP20070327700 申请日期 2007.12.19
申请人 NIKON CORP 发明人 UCHIKAWA TOSHIO
分类号 G01N21/956 主分类号 G01N21/956
代理机构 代理人
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