发明名称 |
Cleaning apparatus and immersion lithographic apparatus |
摘要 |
A cleaning apparatus to clean a substrate or component of an immersion lithographic apparatus is disclosed. The cleaning apparatus may comprise a plasma radical source, a conduit and a radical confinement system. The plasma radical source may provide a flow of radicals. The conduit may supply radicals from the plasma radical source to the surface to be cleaned. The radical confinement system may direct the radicals to clean a localized portion of the surface. The cleaning apparatus may comprise a rotator and may be configured to clean a substrate edge. An immersion lithographic apparatus comprising the cleaning apparatus to clean a surface is also disclosed. The immersion lithographic apparatus may comprise a substrate table to support a substrate and a fluid confinement structure to at least partly confine immersion fluid between a projection system and a substrate table and/or substrate.
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申请公布号 |
US2009174870(A1) |
申请公布日期 |
2009.07.09 |
申请号 |
US20080289621 |
申请日期 |
2008.10.30 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS;JANSEN HANS;LEENDERS MARTINUS HENDRIKUS ANTONIUS;BLOM PAUL;KRAMER RONALD HARM GUNTHER;VAN PUTTEN MICHEL;DE GRAAF ARIEL |
分类号 |
G03B27/52 |
主分类号 |
G03B27/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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