发明名称 Cleaning apparatus and immersion lithographic apparatus
摘要 A cleaning apparatus to clean a substrate or component of an immersion lithographic apparatus is disclosed. The cleaning apparatus may comprise a plasma radical source, a conduit and a radical confinement system. The plasma radical source may provide a flow of radicals. The conduit may supply radicals from the plasma radical source to the surface to be cleaned. The radical confinement system may direct the radicals to clean a localized portion of the surface. The cleaning apparatus may comprise a rotator and may be configured to clean a substrate edge. An immersion lithographic apparatus comprising the cleaning apparatus to clean a surface is also disclosed. The immersion lithographic apparatus may comprise a substrate table to support a substrate and a fluid confinement structure to at least partly confine immersion fluid between a projection system and a substrate table and/or substrate.
申请公布号 US2009174870(A1) 申请公布日期 2009.07.09
申请号 US20080289621 申请日期 2008.10.30
申请人 ASML NETHERLANDS B.V. 发明人 DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS;JANSEN HANS;LEENDERS MARTINUS HENDRIKUS ANTONIUS;BLOM PAUL;KRAMER RONALD HARM GUNTHER;VAN PUTTEN MICHEL;DE GRAAF ARIEL
分类号 G03B27/52 主分类号 G03B27/52
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