发明名称 Low temperature process for polysilazane oxidation/densification
摘要 Semiconductor devices, structures and systems that utilize a polysilazane-based silicon oxide layer or fill, and methods of making the oxide layer are disclosed. In one embodiment, a polysilazane solution is deposited on a substrate and processed with ozone in a wet oxidation at low temperature to chemically modify the polysilazane material to a silicon oxide layer.
申请公布号 US7557420(B2) 申请公布日期 2009.07.07
申请号 US20050321511 申请日期 2005.12.29
申请人 MICRON TECHNOLOGY, INC. 发明人 FUCSKO JANOS;SMYTHE, III JOHN A;LI LI;WALDO GRADY S
分类号 H01L21/76;H01L29/00 主分类号 H01L21/76
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