发明名称 Force sensing integrated readout and active tip based probe microscope systems
摘要 In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance.
申请公布号 US7552625(B2) 申请公布日期 2009.06.30
申请号 US20060398650 申请日期 2006.04.06
申请人 GEORGIA TECH RESEARCH CORPORATION 发明人 DEGERTEKIN FAHRETTIN LEVENT
分类号 G01B5/28;G01Q20/04 主分类号 G01B5/28
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