发明名称 |
Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer |
摘要 |
A scanning probe microscope probe is produced by depositing a raw-material film on the surface of a cone made of Si, etc. and growing a needle-like crystal by using the raw-material film by irradiating an energy beam to a point on the cone at a predetermined distance along the side surface from the cone tip under such conditions as not to melt the cone. Also, a charge density wave quantum phase microscope is provided which uses a probe made of a charge density wave crystal. Also, a charge density wave quantum interferometer is provided which uses the needle-like crystal formed from the charge density wave crystal. Also, the scanning probe microscope probe is formed from a pressure-induced superconducting substance.
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申请公布号 |
US7553335(B2) |
申请公布日期 |
2009.06.30 |
申请号 |
US20050568223 |
申请日期 |
2005.04.22 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY AGENCY |
发明人 |
TANDA SATOSHI;ODA MIGAKU;INAGAKI KATSUHIKO;OHKAWA HIROYUKI;TOSHIMA TAKESHI;MOMONO NAOKI;NISHIDA MUNEHIRO;IDO MASAYUKI |
分类号 |
G01Q70/08;B82B1/00;B82B3/00;G01Q70/12;G01Q70/14;G01Q70/16 |
主分类号 |
G01Q70/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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