发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To improve the life of wiring of a multilayer wiring structure comprising a barrier film consisting of an Mn oxide film which is self-formed on the surface of a Cu wiring pattern. SOLUTION: A carbon-contained film serving as a source of carbon and oxygen is brought into contact with the surface of a Cu wiring pattern where a Cu-Mn alloy layer is formed on a sidewall, which is thermally treated so that Mn atom in the Cu-Mn alloy layer reacts with the carbon atom and oxygen atom from the carbon source, thereby forming an Mn oxide film containing carbon as a barrier film. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009141058(A) 申请公布日期 2009.06.25
申请号 JP20070314729 申请日期 2007.12.05
申请人 FUJITSU MICROELECTRONICS LTD 发明人 KUDO HIROSHI;OTSUKA NOBUYUKI;HANEDA MASAKI;OWADA TAMOTSU
分类号 H01L21/3205;H01L21/314;H01L21/316;H01L21/768;H01L23/52 主分类号 H01L21/3205
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