发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve the life of wiring of a multilayer wiring structure comprising a barrier film consisting of an Mn oxide film which is self-formed on the surface of a Cu wiring pattern. SOLUTION: A carbon-contained film serving as a source of carbon and oxygen is brought into contact with the surface of a Cu wiring pattern where a Cu-Mn alloy layer is formed on a sidewall, which is thermally treated so that Mn atom in the Cu-Mn alloy layer reacts with the carbon atom and oxygen atom from the carbon source, thereby forming an Mn oxide film containing carbon as a barrier film. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009141058(A) |
申请公布日期 |
2009.06.25 |
申请号 |
JP20070314729 |
申请日期 |
2007.12.05 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
KUDO HIROSHI;OTSUKA NOBUYUKI;HANEDA MASAKI;OWADA TAMOTSU |
分类号 |
H01L21/3205;H01L21/314;H01L21/316;H01L21/768;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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