发明名称 X-RAY FOREIGN-MATERIAL DETECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily understanding various information related to a foreign material detected from an inspected object. SOLUTION: The X-ray foreign-material detecting device 1 has an object W to be inspected that is to be conveyed irradiated with X-rays; creates a Foreign-material extraction process image by processing an image to extract a foreign material from the X-ray transmitted image of the object W, based on the transmission amount of X-rays that are transmitted through the object W; and determines by a determination section 33 whether the object W is a non-defective unit, when a foreign material is contained in the object W, as a result of checking the foreign-material extraction process image. when it is not contained. Then, the device 1 specifies, when the object W is determined as a defective unit due to a foreign material contained therein, the foreign material information related to a foreign material by the foreign material extraction process image that has been determined as the defective unit by a foreign material specifying unit 32b, and displays this specified foreign-material information on a display 40. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009139230(A) 申请公布日期 2009.06.25
申请号 JP20070316066 申请日期 2007.12.06
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 INOUE MANABU;SUZUKI TAKASHI
分类号 G01N23/04 主分类号 G01N23/04
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