发明名称 METHOD FOR DETERMINING THE LOCATIONS OF AT LEAST TWO IMPACTS
摘要 A method for determining the locations of at least two impacts is provided to distinguish the locations of one or more impacts on an interface element and distinguish various inputs applied by the same intensity. A method for determining the locations of at least two impacts includes the steps of distinguishing the location of an impact, that is, a maximum impact(S1), determining a correction signal according to correlation functions of sensed signals and a reference signal for a reference impact(S2), and determining the location of a next impact based on the correction signal(S3).
申请公布号 KR20090068149(A) 申请公布日期 2009.06.25
申请号 KR20080129434 申请日期 2008.12.18
申请人 SENSITIVE OBJECT 发明人 DUHEILLE REMI;SCHEVIN OLIVIER;KIRIING ROS
分类号 G01B21/00;G01B17/00;G01D21/00;G06K11/00 主分类号 G01B21/00
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