发明名称 METHOD OF FORMING A TRENCH AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME
摘要 A method for forming a trench and a manufacturing method of a semiconductor device using the same are provided to form easily trenches having different depth values by using a polymer bonding process. A plurality of first patterns(104) and a plurality of second patterns(106) are formed on a substrate(100). The first patterns are separated in a first width from each other. The second patterns are separated in a second width from each other. The second width is larger than the first width. The substrate is etched by using the first and second patterns as etch masks. A first trench having a first depth value is formed. A second trench having a second depth value is formed. A gap between the first patterns is filled with a sacrificial layer. The substrate is etched by using the sacrificial layer, the first patterns, and the second patterns as etch masks. The second trench having a third depth value is formed. The third depth value is larger than the second depth value.
申请公布号 KR20090067269(A) 申请公布日期 2009.06.25
申请号 KR20070134840 申请日期 2007.12.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, DU HYUN;SONG, JONG HEUI;JEONG, SANG SUP;KANG, TAE WOO;YOO, SEUNG JOO
分类号 H01L21/76 主分类号 H01L21/76
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