| 摘要 |
PROBLEM TO BE SOLVED: To solve the following conventional problem: even if can know a position of an address signal line wherein abnormality occurs, it cannot be distinguished whether it short-circuits or is opened. SOLUTION: This inspection method for a memory having a plurality of address lines 3 designating an address of the memory 1 has steps: for determining a bit specifying a reference address, an inspection address, and an inspection adjacent address such that a combination between a bit of a first inspection address signal line A0 and a bit of a second inspection address signal line A1 varies and that the other bits except the bit of the first inspection address signal line and the bit of the second address signal line become common; for writing respectively different data into the reference address, the inspection address, and the inspection adjacent address; and for reading data from the reference address, the inspection address, and the inspection adjacent address, and deciding whether the data are equal to the written data or not. COPYRIGHT: (C)2009,JPO&INPIT
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