发明名称 METHOD OF MEASURING SURFACE SHAPE USING MOIRE TECHNIQUE
摘要 A surface shape measuring method using moire technique is provided to form an oxide film in the surface of a shape measurement object and improve the sharpness of a lattice pattern projected to the surface, thereby obtaining a clear moire pattern. An oxide film is formed on the surface of a shape measurement object(S11). A lattice pattern is projected to the shape measurement object in a collimated light state(S12). A lattice pattern image projected to the shape measurement object is detected by the projection of the lattice pattern(S13). A virtual lattice pattern having the same interval and a different angle compared with the lattice pattern is produced. A moire pattern is formed by overlapping the virtual lattice image over the lattice pattern image projected onto the shape measurement object(S14).
申请公布号 KR20090066952(A) 申请公布日期 2009.06.24
申请号 KR20070134702 申请日期 2007.12.20
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 CHOI, EUN HEE;AHN, HONG GYU;JU, HONG LYOUL;PARK, SEONG SU;PARK, SEUNG HAN
分类号 G01B11/25;G01B11/24 主分类号 G01B11/25
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