发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF
摘要 A semiconductor device and a manufacturing method thereof are provided to reduce grain defects and grating defects in a cell region and a peripheral region by performing a partial CVD(Chemical Vapor Deposition) process after a SEG(Selective Epitaxy Growth) process in order to form a second active pattern and a second isolation pattern in the peripheral region. A first active pattern includes a first single crystalline semiconductor grown from a surface of a substrate(100) of a first region. A first isolation pattern is arranged on the first region in order to define the first active pattern. The first isolation pattern includes a first insulating material for insulating electrically the first active patterns from each other. A second active pattern includes a second single crystalline semiconductor which is grown from the surface of the substrate of a second region(120). A second isolation pattern is arranged on the second region in order to define the second active pattern. The second isolation pattern includes a second insulating material for insulating electrically the second active patterns from each other. The second isolation pattern has a lateral profile which is opposite to the lateral profile of the first insulating pattern.
申请公布号 KR20090065572(A) 申请公布日期 2009.06.23
申请号 KR20070132934 申请日期 2007.12.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, YONG HOON;LEE, JONG WOOK
分类号 H01L21/762 主分类号 H01L21/762
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