发明名称 INSPECTION DEVICE OF CONNECTION STRUCTURE FOR SECONDARY BATTERY AND ITS INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide the inspection device and the inspection method of a connection structure for a secondary battery, which can appropriately inspect the connection state of a fillet formed in the connection part of each electrode and a current collecting plate. SOLUTION: A computer terminal 31 inspects the connection state of the fillet by analyzing two images of a front illumination image photographed with only a first illumination system 26 arranged on the side on the same side as an imaging device 25 of a pair of connection structure 22 lit and a rear illumination image photographed with only a second illumination system 27 arranged to counter the imaging device 25 positioned on both sides of the pair of connection structures 22. In the rear illumination image, when illuminance of illumination is enhanced in order to appropriately detect the shape of the fillet, the position of an electrode plate is made indefinite. Since the position of the electrode plate is inspected from the front illumination image, the illuminance of illumination in photographing of the rear illumination image can be increased, and the connection state of the fillet can appropriately inspected. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009129843(A) 申请公布日期 2009.06.11
申请号 JP20070306273 申请日期 2007.11.27
申请人 PANASONIC EV ENERGY CO LTD 发明人 SOTOOKA SAKAE;NOMURA FUSAYOSHI
分类号 H01M10/04 主分类号 H01M10/04
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