| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problem that since an analytical circuit previously prepared in an LSI is utilized for observing the internal operation state of the system LSI in the conventional method, the observation can correspond only to a decided analytical pattern, and when the analytical circuit is constituted of a logic changeable block in the LSI in order to evade such the defect, analysis is stopped during the change of logical configuration, and continuous analysis is made impossible. <P>SOLUTION: A semiconductor inside monitoring apparatus is provided with a mechanism for holding a present analytical condition during a logical change and a buffer capable of storing analytical data to prevent omission of the analytical data. <P>COPYRIGHT: (C)2009,JPO&INPIT |
