发明名称 SECONDARY ION MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To solve a problem in SIMS that it is difficult to analyze a biomedical specimen in its raw state, since an analysis specimen is brought inside a vacuum container and is analyzed in vacuum, and thus in the SIMS on a water-containing biomedical specimen, and the like, and analysis specimen becomes dry or frozen due to the evaporation of water in the analysis specimen. SOLUTION: In secondary ion mass spectrometry, the surface of the analysis specimen is coated with "an ionic liquid", before the analysis specimen is set into a vacuum atmosphere. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009128045(A) 申请公布日期 2009.06.11
申请号 JP20070300440 申请日期 2007.11.20
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 FUJIWARA YUKIO;NONAKA HIDEHIKO;SAITO NAOAKI
分类号 G01N23/225 主分类号 G01N23/225
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