发明名称 TECHNIQUE FOR ANALYZING SCRATCH TEST
摘要 PROBLEM TO BE SOLVED: To carry out image analysis, at any moment relatively to the moment when the scratches are made. SOLUTION: The digital image-capturing device equipped with a high power field lens capable of photograph only a scratched part of scratch and an indentor applying force on the bulk are provided. The method comprises the steps of: determining the starting position of the scratch relative to the reference position; making the scratch to the bulk by means of the indentor; recording the applied force to make the scratch and at least one measured feature of scratch as a function of displacement of the indentor on the bulk relative to the reference position; acquiring and recording the whole of the significant portion of the scratch as one-set of a plurality of images; synchronizing the plurality of recorded images, the applied force and the measured features as a function of displacement of the indentor; displaying the curves of the applied force and the measured features as a function of the displacement the indentor; and displaying a panoramic image of the significant portion of the scratch reconstructed from the plurality of recorded images. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009128368(A) 申请公布日期 2009.06.11
申请号 JP20080300623 申请日期 2008.11.26
申请人 CSM INSTRUMENTS SA 发明人 COUDERT PIERRE-JEAN;BELLATON BERTRAND
分类号 G01N3/42 主分类号 G01N3/42
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