发明名称 POLISHING APPARATUS AND POLISHING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To polish and remove an extra conductive film while preventing the occurrence of erosion and without lowering the throughput. <P>SOLUTION: A polishing apparatus includes: a polishing table 100 having a polishing surface; a top ring 10 for holding a workpiece to be polished having a surface conductive film 6, and slidably pressing the conductive film 6 against the polishing surface to polish the conductive film 6; an optical sensor 130 for monitoring the polishing state of the conductive film 6 by emitting light toward the conductive film 6 of the workpiece held by the top ring 10, receiving reflected light from the conductive film 6, and measuring a change in the reflectance in the reflected light; and a control section 132 for controlling a pressure at which the workpiece is pressed on the polishing surface. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009129970(A) 申请公布日期 2009.06.11
申请号 JP20070300511 申请日期 2007.11.20
申请人 EBARA CORP 发明人 OTA MASAAKI;SHIMIZU NOBU;KOBAYASHI YOICHI
分类号 H01L21/304;B24B37/013;B24B49/12 主分类号 H01L21/304
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